MOROOKA Masami | Department of Electrical Engineering, Fukuoka Institute of Technology
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概要
- Morooka Masamiの詳細を見る
- 同名の論文著者
- Department of Electrical Engineering, Fukuoka Institute of Technologyの論文著者
関連著者
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TOMOKAGE Hajime
Department of Electronics, Fukuoka University
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MOROOKA Masami
Department of Electrical Engineering, Fukuoka Institute of Technology
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Tomokage H
Fukuoka Univ. Fukuoka Jpn
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Tomokage Hajime
Department Of Electronics Fukuoka University
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Tomokage Hajime
Department Of Electronics Faculty Of Engineering Fukuoka University
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Tomokage Hajime
Department Of Electrical Engineering Faculty Of Engineering Kyushu University
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師岡 正美
福岡工業大学電気工学科
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Morooka Masami
Department Of Electrical Engineering Fukuoka Institute Of Technology
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Yoshida M
Functional Materials Research Laboratories Nec Corporation
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Yoshida M
Yoshida Semiconductor Lab. Fukuoka Jpn
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YOSHIDA Masayuki
Kyushu Institute of Design
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Yoshida M
National Institute Of Advanced Industrial And Science Technology (aist)
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KITAGAWA Hajime
Department of Electronic Materials Engineering, Fukuoka Institute of Technology
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Kitagawa H
Canon Inc. Utsunomiya Jpn
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Kitagawa Hajime
Deportment Of Information Electronics Fukuoka Institute Of Technology
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Kitagawa Hajime
Production-systems Engineering Toyohashi University Of Technology
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MIYAMOTO Tokuo
Department of Electronics, Faculty of Engineering, Fukuoka University
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Kitagawa Hajime
Department Of Electrical Engineering Faculty Of Engineering Kyushu University
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Miyamoto T
Tokyo Inst. Technol. Tokyo Jpn
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Miyamoto Tokuo
Department Of Electronics Engineering And Computer Science Faculty Of Engineering Fukuoka University
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Hirota Shouichi
Department of Electronics, Fukuoka University
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Hirota Shouichi
Department Of Electronics Fukuoka University
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YAMAKAWA Tetsuya
Department of Electronics Engineering, Fukuoka University
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Yamakawa T
Department Of Electronics Engineering Fukuoka University:(present Address)fujitsu Ltd.
著作論文
- Changes of DLTS Spectrum with Gold Concentration and Gold-Diffusion Temperature in N-Type Silicon
- Annealing of Supersaturated Low-Temperature Substitutional Gold in Silicon
- A Simple Method to Determine λ from Isothermal Capacitance Measurements
- Three States of Substitutional Gold in Silicon
- Effect of Annealing Method upon Annealing Characteristics of Supersaturated Substitutional Gold in Silicon
- Reverse Recovery Time of Junction Diodes with High Capture Rate of Minority Carriers in the Low Injection Level