NAKAMURA Kou | Department of Electronic Engineering, Faculty of Engineering, Tohoku University
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概要
- Nakamura Kouの詳細を見る
- 同名の論文著者
- Department of Electronic Engineering, Faculty of Engineering, Tohoku Universityの論文著者
関連著者
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Ohmi Tadahiro
Department Of Electronic Engineering Graduate School Of Engineering Tohoku University
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NAKAMURA Kou
Department of Electronic Engineering, Faculty of Engineering, Tohoku University
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MAKIHARA Koji
Department of Electronic Engineering, Faculty of Engineering, Tohoku University
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Ohmi Tadahiro
Department Of Electronic Engineering
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Makihara K
Department Of Electronics Tohoku University
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Makihara Koji
Department Of Applied Chemistry Graduate School Of Engineering Kyushu University
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MORITA Mizuho
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
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Morita M
Department Of Electronics Tohoku University
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Morita Mizuho
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
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Yamamoto Kazuma
Department Of Electronic Engineering Faculty Of Engineering Tohoku University:laboratory For Microel
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Morita M
Advanced Materials & Technology Research Laboratories Nippon Steel Corporation
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OHMI Kazuyuki
Department of Electronic Engineering, Faculty of Engineering, Tohoku University
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KWON Myoung
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology
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Kwon Myoung
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
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TERAMOTO Akinobu
Department of Electronic Engineering, Faculty of Engineering, Tohoku University
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Teramoto Akinobu
Ulsi Laboratory Mitsubishi Electric Corporation
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Teramoto Akinobu
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
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Ohmi K
Device Development Center Canon Inc.
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Ohmi Kazuyuki
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
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Teramoto Akinobu
University Of Tohoku New Industry Creation Hatchery Center (niche)
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Yamamoto Kazuma
Department of Electrical Engineering and Computer Science, Nagoya University
著作論文
- Silicon Wafer Orientation Dependence of Metal Oxide Sermiconductor Device Reliability
- Preoxide-Controlled Oxidation for Very Thin Oxide Films