Yamamoto Kazuma | Department Of Electronic Engineering Faculty Of Engineering Tohoku University:laboratory For Microel

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概要

• 同名の論文著者
• Department Of Electronic Engineering Faculty Of Engineering Tohoku University:laboratory For Microelの論文著者

関連著者

• Yamamoto Kazuma

  Department Of Electronic Engineering Faculty Of Engineering Tohoku University:laboratory For Microel

• Yamamoto Kazuma

  Department of Electrical Engineering and Computer Science, Nagoya University

• Ohmi Tadahiro

  Department Of Electronic Engineering Graduate School Of Engineering Tohoku University

• NAKAMURA Kou

  Department of Electronic Engineering, Faculty of Engineering, Tohoku University

• OHMI Kazuyuki

  Department of Electronic Engineering, Faculty of Engineering, Tohoku University

• MAKIHARA Koji

  Department of Electronic Engineering, Faculty of Engineering, Tohoku University

• Ohmi Tadahiro

  Department Of Electronic Engineering

• Ohta Daisuke

  Department Of Breast Cancer Research Tokyo Metropolitan Cancer Detection Center

• Ohmi K

  Device Development Center Canon Inc.

• Ohmi Kazuyuki

  Department Of Electronic Engineering Faculty Of Engineering Tohoku University

• Makihara K

  Department Of Electronics Tohoku University

• Makihara Koji

  Department Of Applied Chemistry Graduate School Of Engineering Kyushu University

• Matsumura Toshiro

  Department of Electrical Engineering and Computer Science, Nagoya University

• SHIBUYA Masatoyo

  Central Research Institute of Electric Power Industry

• Matsumura T

  Department Of Electrical Engineering And Computer Science Nagoya University

• Matsumura Toshiro

  Department Of Electrical Engineering And Computer Science Nagoya University

• Yokomizu Y

  Department Of Electrical Engineering And Computer Science Nagoya University

• Yokomizu Yasunobu

  Department Of Electrical Engineering And Computer Science Nagoya University

• Almiron Pablo

  Department of Electrical Engineering and Computer Science, Nagoya University

• Ohta Daisuke

  Department of Electrical Engineering and Computer Science, Nagoya University

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著作論文

• Silicon Wafer Orientation Dependence of Metal Oxide Sermiconductor Device Reliability
• Breakdown Voltage of CO2 at Temperatures around 4000K and in Range from 300 to 700K

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