Goo Hyun-Mo | Department of Electronic Materials Engineering, Kwangwoon University
スポンサーリンク
概要
関連著者
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Lee Seong-jae
Nano Bio-electric Devices Team It Convergence & Components Laboratory Etri
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Baek In-bok
Nano Bio-electric Devices Team It Convergence & Components Laboratory Etri
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Lee Woo-hyun
Electronics Materials Kwangwoon University
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Lee Woo-Hyun
Department of Electronic Materials Engineering, Kwangwoon University
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Cho Won-Ju
Department of Electronic Materials Engineering, Kwangwoon University
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Ahn Chang-Geun
Nano Bio-electric Devices Team, IT Convergence & Components Laboratory
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Yang Jong-Heon
Nano Bio-electric Devices Team, IT Convergence & Components Laboratory
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Goo Hyun-Mo
Department of Electronic Materials Engineering, Kwangwoon University
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Cho Won-ju
Electronics Materials Kwangwoon University
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Ahn C‐g
Electronics And Telecommunications Res. Inst. Daejon Kor
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Ahn Chang-geun
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Cho W‐j
Lg Semicon Co. Ltd.
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Goo Hyun-mo
Department Of Electronic Materials Engineering Kwangwoon University
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Cho W‐j
Electronics Materials Kwangwoon University
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Cho Won-ju
Department Of Electronic Material Engineering Kwangwoon University
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Ahn Chang-geun
Nano Bio-electric Devices Team It Convergence & Components Laboratory Etri
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Yang Jong-heon
Nano-bio Electronic Devices Team Electronics And Telecommunications Research Institute
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AHN Chang-Geun
Nano-Bio Electronic Devices Team, Electronics and Telecommunications Research Institute
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YANG Jong-Heon
Nano-Bio Electronic Devices Team, Electronics and Telecommunications Research Institute
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Back In-Bok
Nano Bio-electric Devices Team, IT Convergence & Components Laboratory
著作論文
- Analysis of Interface Property of SiGe-On-Insulator (SGOI) Substrate with a Strained-Si Layer for Nano-CMOS Device Applications(Session 4 Silicon Devices II,AWAD2006)
- Analysis of Interface Property of SiGe-On-Insulator (SGOI) Substrate with a Strained-Si Layer for Nano-CMOS Device Applications(Session 4 Silicon Devices II,AWAD2006)
- Analysis of Interface Property of SiGe-On-Insulator (SGOI) Substrate with a Strained-Si Layer for Nano-CMOS Device Applications
- Analysis of Interface Property of SiGe-On-Insulator (SGOI) Substrate with a Strained-Si Layer for Nano-CMOS Device Applications