Matsuo J | Fujitsu Lab. Atsugi
スポンサーリンク
概要
関連著者
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Matsuo J
Fujitsu Lab. Atsugi
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Nakamura M
Institute Of Advanced Material Study And Department Of Molecular Science And Technology Graduate Sch
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YAMADA Isao
Ion Beam Engineering Experimental Laboratory, Kyoto University
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Matsuo Jiro
Ion Beam Engineering Experimental Laboratory Kyoto University
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Matsuo Jiro
Fujitsu Laboratories
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Akizuki Makoto
Ion Beam Engineering Experimental Laboratory Kyoto University
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Harada M
National Res. Inst. Metals Ibaraki Jpn
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Nakamura M
Toshiba Corp. Yokohama Jpn
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Ogasawara Satoru
Microelectronics Research Center, SANYO Electric Co., Ltd.,
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Harada Mitsuaki
Microelectronics Research Center, SANYO Electric Co., Ltd.,
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Doi Atsumasa
Microelectronics Research Center, SANYO Electric Co., Ltd.,
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Harada Mitsuaki
Microelectronics Research Center Sanyo Electric Co. Ltd.
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Doi Atsumasa
Microelectronics Research Center Sanyo Electric Co. Ltd.
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KOSHINO Keiji
Basic Process Development Division, Fujitsu Ltd.
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Ogasawara Satoru
Microelectronics Research Center Sanyo Electric Co. Ltd.
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Koshino Keiji
Basic Process Development Division Fujitsu Ltd.
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Yamada Isao
Ion Beam Engineering Experimental Laboratory Kyoto University
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NAKAMURA Moritaka
Basic Process Development Div.
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Nakamura Moritaka
Process Development Division Fujitsu Limited
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AKIZUKI Makoto
Microelectronics Research Center, SANYO Electric Co., Ltd.
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KOSHINO Keiji
Process Development Division, FUJITSU LIMITED
著作論文
- Low-Temperature Oxidation of Silicon by O_2 Cluster Ion Beams
- A New Low-Temperature Oxidation Technique by Gas Cluster Ion Beams
- Chemical States of Bromine Atoms on SiO_2 Surface after HBr Reactive Ion Etching : Analysis of Thin Oxide
- Mechanism of High Selectivity and Impurity Effects in HBr RIE: In-Situ Surface Analysis