Majima Hideaki | Institute Of Industrial Science University Of Tokyo

スポンサーリンク

概要

• 同名の論文著者
• Institute Of Industrial Science University Of Tokyoの論文著者

関連著者

• Majima Hideaki

  Institute Of Industrial Science University Of Tokyo

• Hiramoto Toshiro

  Institute Of Industrial Science The University Of Tokyo

• Saitoh Masumi

  Institute Of Industrial Science University Of Tokyo

• Hiramoto Toshiro

  Institute Of Industrial Science University Of Tokyo

• SAITOH Masumi

  Institute of Industrial Science, University of Tokyo

• TAKAHASHI Nobuyoshi

  Institute of Industrial Science, University of Tokyo

• Inukai Takashi

  Institute Of Industrial Science The University Of Tokyo

• Wang Haining

  Institute Of Industrial Science University Of Tokyo

• HIRAMOTO Toshiro

  Institute Industrial Science, The University of Tokyo

• Majima Hideaki

  The Institute Of Industrial Science The University Of Tokyo

• Hiramoto Toshiro

  The Institute Of Industrial Science The University Of Tokyo:vlsi Design And Education Center The Uni

• INUKAI Takashi

  The Institute of Industrial Science, The University of Tokyo

• WANG Haining

  Institute of Industrial Science, University of Tokyo

• INUKAI Takashi

  Institute of Industrial Science, University of Tokyo

• Majima H

  The Institute Of Industrial Science The University Of Tokyo

• Inukai T

  The Institute Of Industrial Science The University Of Tokyo

• Takahashi N

  Institute Of Industrial Science University Of Tokyo

• Hiramoto Toshiro

  Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

• Majima Hideaki

  Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

• Inukai Takashi

  Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

もっと見る 閉じる

著作論文

• Effects of Dot Size and its Distribution on Electron Number Control in Metal-Oxide-Semiconductor-Field-Effect-Transistor Memories Based on Silicon Nanocrystal Floating Dots
• Tunneling Barrier Structures in Room-Temperature Operating Silicon Single-Electron and Single-Hole Transistors
• Tunneling Barrier Structures in Room-Temperature Operating Silicon Single-Electron and Single-Hole Transistors
• Effects of Dot Size and its Distribution on Electron Number Control in Metal-Oxide-Semiconductor-Field-Effect-Transistor Memories Based on Silicon Nanocrystal Floating Dots

スポンサーリンク