Yasuda Yukio | Toshiba Research And Development Center Tokyo Shibaura Electric Co. Ltd.
スポンサーリンク
概要
関連著者
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Yasuda Yukio
Toshiba Research And Development Center Tokyo Shibaura Electric Co. Ltd.
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KAWAJI Shinji
Department of Physics,Gakushuin University
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Kawaji Shinji
Gakushuin University
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Kawaji Shinji
Department Of Physics And Chemistry Gakushuin University
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Onga Shinji
Enginerring Design Center Case Western Reserve University
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Hatanaka Katunori
Department Of Physics Gakushuin University
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ONGA Shinji
Toshiba Research and Development Center
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: A-7:
Siemens Ag Research Laboratories
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Yoshii Toshio
Toshiba Research And Development Center Tokyo Shibawa Electric Co. Ltd.
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Nishi Yoshio
Toshiba Research And Development Center Tokyo Shibaura Electric Co. Ltd.
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ONGA Shinji
Enginerring Design Center, Case Western Reserve University
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HATANAKA Katunori
Department of Physics, Gakushuin University
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: A-7:
Toshiba Research and Development Center, Tokyo Shibawa Electric Co., Ltd.
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HATANAKA Katsunori
Faculty of Science, Gakushuin University
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HATANAKA Katsunori
Department of Physics, Gakushuin University
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Yasuda Yukio
Toshiba Research And Development Center Tokyo Shibawa Electric Co. Ltd.
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Hatanaka Katsunori
Faculty Of Science Gakushuin University
著作論文
- Effect of Residual Stress on Hole Mobility of SOS MOS Devices
- Effects of Crystalline Defects on Electrical Properties in Silicon Films on Sapphire
- Influence of Crystalline Defects and Residual Stress on the Electrical Characteristics of SOS MOS Devices
- Epitaxial Growth of Silicon Films on Sapphire and Spinel by Vacuum Evaporation