HATANAKA Katsunori | Department of Physics, Gakushuin University
スポンサーリンク
概要
関連著者
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ONGA Shinji
Toshiba Research and Development Center
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Kawaji Shinji
Gakushuin University
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Kawaji Shinji
Department Of Physics And Chemistry Gakushuin University
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Onga Shinji
Enginerring Design Center Case Western Reserve University
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Hatanaka Katunori
Department Of Physics Gakushuin University
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HATANAKA Katsunori
Department of Physics, Gakushuin University
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Nakamura Koichi
Department of Material Physics, Faculty of Engineering Science, Osaka University
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Yasuda Yukio
Toshiba Research And Development Center Tokyo Shibaura Electric Co. Ltd.
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KAWAJI Shinji
Department of Physics,Gakushuin University
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Nakamura Koichi
Department Of Clinical Pharmacology And Therapeutics Oita University Faculty Of Medicine
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Nakamura Koichi
Department of Chemistry, Faculty of Science, Hokkaido University
著作論文
- Influence of Crystalline Defects and Residual Stress on the Electrical Characteristics of SOS MOS Devices
- Mobility Hump and Inversion Layer Subbands in Si on Sapphire