Sakui K | Toshiba Corp. Yokohama
スポンサーリンク
概要
関連著者
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Sakui K
Toshiba Corp. Yokohama
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Aritome Seiichi
Ulsi Research Laboratories Toshiba R&d Center
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Masuoka F
Tohoku Univ. Sendai Jpn
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Masuoka Fujio
The Reserch Institute Of Electrical Communication Tohoku University
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Masuoka F
Research Institute Of Electrical Communication Tohoku University
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ARITOME Seiichi
ULSI Research Laboratories, Toshiba R&D Center
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SAKUI Koji
ULSI Research Center, TOSHIBA Corporation
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Shirota Riichiro
Microelectronics Engineering Lab. Toshiba
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Shirota Riichiro
Toshiba Research And Development Center Ulsi Research Laboratories
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Sakui Koji
The Ulsi Research Center Toshiba Corporation
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Endoh T
Tohoku Univ. Sendai‐shi Jpn
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Endoh T
Tohoku Univ. Sendai Jpn
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Hazama Hiroaki
Semiconductor Device Engineering Laboratory Toshiba Corporation
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Masuoka Fujio
The Ulsi Research Center Toshiba Corporation
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Hemink Gertjan
Ulsi Research Center Toshiba Corporation
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WATANABE Shunji
Nikon Corporation
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MIYAMOTO Jun-ichi
Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATION
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HIMENO Toshihiko
Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATION
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MATSUKAWA Naohiro
Semiconductor Quality Assurance Department, TOSHIBA CORPORATION
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SAKUI Koji
Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATION
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OSHIKIRI Masamitsu
Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATION
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MASUDA Kazunori
Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATION
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KANDA Kazushige
Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATION
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ITOH Yasuo
Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATION
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IIZUKA Hirohisa
ULSI Research Laboratories, Toshiba R&D Center
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ENDOH Tetsuo
ULSI Research Laboratories, Toshiba R&D Center
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SHIROTA Riichiro
ULSI Research Laboratories, Toshiba R&D Center
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MASUOKA Fujio
ULSI Research Laboratories, Toshiba R&D Center
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Aritome Seiichi
the ULSI Research Center, TOSHIBA CORPORATION
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Shirota Riichiro
the ULSI Research Center, TOSHIBA CORPORATION
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WATANABE Shigeyoshi
ULSI Research Laboratories, Toshiba Corporation
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OHUCHI Kazunori
ULSI Research Laboratories, Toshiba Corporation
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Watanabe Souichi
The Niigata Institute Of Technology
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HATAKEYAMA Ikuo
ULSI Research Center, TOSHIBA Corporation
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YAMAGUCHI Tetsuya
ULSI Research Center, TOSHIBA Corporation
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SHUTO Susumu
ULSI Research Center, TOSHIBA Corporation
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MARUYAMA Tooru
ULSI Research Center, TOSHIBA Corporation
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WATANABE Hiroshi
ULSI Research Center, TOSHIBA Corporation
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TANAKA Tomoharu
ULSI Research Center, TOSHIBA Corporation
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MOMODOMI Masaki
ULSI Research Center, TOSHIBA Corporation
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HASEGAWA Takehiro
ULSI Research Center, TOSHIBA Corporation
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FUSE Tsuneaki
ULSI Research Center, TOSHIBA Corporation
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SESHITA Toshiki
ULSI Research Center, TOSHIBA Corporation
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Miyamoto Jun-ichi
Semiconductor Device Engineering Laboratory Toshiba Corporation
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Shuto Susumu
Ulsi Research Center Toshiba Corporation
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Endoh T
Research Institute Of Electrical Communication Tohoku University
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Fuse T
Research Amp Development Center Ulsi Research Laboratories Toshiba Corporation
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Fuse Tsuneaki
Ulsi Research Center Toshiba Corporation.
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Maruyama Tooru
Ulsi Research Center Toshiba Corporation
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Iizuka Hirohisa
Toyota Central Research & Development Labs. Inc.
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Miyamoto J
Semiconductor Device Engineering Laboratory Toshiba Corporation
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Seshita Toshiki
Ulsi Research Center Toshiba Corporation
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Watanabe S
Fujitsu Lab. Ltd. Kawasaki‐shi Jpn
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Kanda Kazushige
Semiconductor Device Engineering Laboratory Toshiba Corporation
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Itoh Y
Semiconductor Device Engineering Laboratory Toshiba Corporation
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OHUCHI Kazunori
Research amp Development Center, ULSI Research Laboratories, Toshiba Corporation
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Ohuchi Kazunori
Research Amp Development Center Ulsi Research Laboratories Toshiba Corporation
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Momodomi Masaki
Ulsi Research Center Toshiba Corporation
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Tanaka Tomoharu
Ulsi Research Center Toshiba Corporation
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Hatakeyama Ikuo
Ulsi Research Center Toshiba Corporation
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Hasegawa Takehiro
The Femtosecond Technology Research Association
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Oshikiri Masamitsu
Semiconductor Device Engineering Laboratory Toshiba Corporation
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Himeno Toshihiko
Semiconductor Device Engineering Laboratory Toshiba Corporation
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Matsukawa Naohiro
Semiconductor Quality Assurance Department Toshiba Corporation
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Watanabe Shigeyoshi
Ulsi Research Center Toshiba Corporation.
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Yamaguchi Tetsuya
Ulsi Research Center Toshiba Corporation
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Masuda K
Nec Corp. Kawasaki‐shi Jpn
著作論文
- Data Retention Characteristics of Flash Memory Cells after Write and Erase Cycling (Special Section on High Speed and High Density Multi Functional LSI Memories)
- A New Reverse Base Current (RBC) of the Bipolar Transistor Induced by Impact Ionization
- A Novel Threshold Voltage Distribution Measuring Technique for Flash EEPROM Devices (Special Issue on Microelectronic Test Structure)
- An Advanced NAND-Structure Cell Technology for Reliable 3.3 V 64 Mb Electrically Erasable and Programmable Read Only Memories (EEPROMs)