KYUNO Kentaro | Department of Materials Science, Graduate School of Engineering, The University of Tokyo
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概要
- Kyuno Kentaroの詳細を見る
- 同名の論文著者
- Department of Materials Science, Graduate School of Engineering, The University of Tokyoの論文著者
関連著者
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KYUNO Kentaro
Department of Materials Science, Graduate School of Engineering, The University of Tokyo
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TORIUMI Akira
Department of Materials Science, Graduate School of Engineering, The University of Tokyo
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Toriumi Akira
The Authors Are With Advanced Lsi Technology Laboratory Toshiba Corporation:presently With The Depar
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Toriumi Akira
Department Of Applied Physics University Of Tokyo
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Kyuno Kentaro
Institute Of Industrial Science University Of Tokyo
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弓野 健太郎
Department Of Materials Engineering School Of Engineering The University Of Tokyo
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Kyuno Kentaro
Department Of Materials Science Shibaura Institute Of Technology
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Kyuno Kentaro
Department of Materials Engineering, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-8656, Japan
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KITA Koji
Department of Materials Science, Graduate School of Engineering, The University of Tokyo
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Kita Koji
Department Of Materials Engineering School Of Engineering The University Of Tokyo
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Kita Koji
Department of Material Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan
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Toriumi Akira
Mirai-advanced Semiconductor Research Center (mirai-asrc) National Institute Of Advanced Industrial
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Toriumi Akira
Advanced Lsi Technology Toshiba Corporation
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弓野 健太郎
東大教養
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Toriumi Akira
Mirai-asrc Aist
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Toriumi A
Univ. Tokyo Tokyo Jpn
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Kita Koji
Department Of Materials Engineering The University Of Tokyo
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Toriumi Akira
Department Of Materials Engineering The University Of Tokyo
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Zhao Yi
Department Of Materials Engineering School Of Engineering The University Of Tokyo
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YAMAMOTO Yoshiki
Department of Materials Engineering, School of Engineering, The University of Tokyo
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Yamamoto Yoshiki
Department Of Materials Engineering School Of Engineering The University Of Tokyo
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Zhao Yi
Department Of Chemistry Tongji University
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Toyama Masahiro
Department Of Materials Engineering School Of Engineering The University Of Tokyo
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Komoda Taiki
Department Of Materials Science Graduate School Of Engineering The University Of Tokyo
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Toriumi Akira
Department Of Materials Engineering School Of Engineering The University Of Tokyo
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Toyama Masahiro
Department Of Cardiology Institute Of Clinical Medicine University Of Tsukuba
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NOMURA Hideyuki
Department of Internal Medicine, Shin-Kokura Hospital
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ENDO Yasuhiro
Department of Materials Science, Graduate School of Engineering, The University of Tokyo
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Endo Yasuhiro
Department Of Materials Science Graduate School Of Engineering The University Of Tokyo
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TOMIDA Kazuyuki
Research Fellow of the Japan Society for the Promotion of Science
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TOMIDA Kazuyuki
Department of Materials Engineering, School of Engineering, The University of Tokyo
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SHIMIZU Haruka
Department of Materials Science, School of Engineering, The University of Tokyo
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SASAGAWA Masashi
Department of Materials Science, School of Engineering, The University of Tokyo
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Nomura Hideyuki
Department Of Electronics The University Of Electro-communications
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Toriumi Akira
Advanced Lsi Technology Laboratory Research & Development Center Toshiba Co.
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Sasagawa Masashi
Department Of Materials Science School Of Engineering The University Of Tokyo
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Nomura Hideyuki
Department Of Materials Engineering School Of Engineering The University Of Tokyo
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Shimizu Haruka
Department Of Materials Science School Of Engineering The University Of Tokyo
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Endo Yasuhiro
Department Of Internal Medicine Heart Institute Japan Tokyo Women's Medical College
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Nomura Hideyuki
Department of Electronic Engineering, The University of Electro-Communications
著作論文
- Study of La Concentration Dependent V_ Shift in Metal/HfLaOx/Si Capacitors
- Performance and Degradation in Single Grain-size Pentacene Thin-Film Transistors
- Field-Dependent Mobility of Highly Oriented Pentacene Thin-Film Transistors
- Suppression of Leakage Current and Moisture Absorption of La_2O_3 films with Ultraviolet Ozone Post Treatment
- Thermally Robust Y_2O_3/Ge MOS Capacitors
- Moisture Absorption-Induced Permittivity Deterioration and Surface Roughness Enhancement of Lanthanum Oxide Films on Silicon
- Design Methodology for La_2O_3-Based Ternally Higher-κ Dielectrics
- A New Hf-based Dielectric Member, HfLaOx, for Amorphous High-k Gate Insulators in Advanced CMOS
- Generalized Model of Oxidation Mechanism at HfO_2/Si Interface with Post-Deposition Annealing
- Dielectric Constant Increase of Yttrium-Doped HfO_2 by Structural Phase Modification
- Far Infrared Study of Structural Distortion and Transformation of HfO_2 by Introducing a Slight Amount of Si
- Stable Observation of the Evolution of Leakage Spots in HfO_2/SiO_2 stacked structures by UHV-C-AFM
- Difference between O_2 and N_2 Annealing Effects on CVD-SiO_2 Film Quality Studied by the Time-Dependent OCP Measurement
- Advantages of Ge (111) Surface for High Quality HfO_2/Ge Interface
- New Method for Characterizing Dielectric Properties of High-k Films with Time-Dependent Open-Circuit Potential Measurement