Fundamentals of X-ray Diffraction Characterisation of Strain in GaN Based Compounds (Special Issue : Recent Advances in Nitride Semiconductors)
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概要
著者
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Humphreys Colin
Department Of Materials Science And Metallurgy University Of Cambridge
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Kappers Menno
Department Of Materials Science And Metallurgy University Of Cambridge
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Oliver Rachel
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB2 3QZ, U.K.
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Oehler Fabrice
Department of Materials Science and Metallurgy, University of Cambridge, CB2 3QZ, Cambridge, U.K.
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Vickers Mary
Department of Materials Science and Metallurgy, University of Cambridge, CB2 3QZ, Cambridge, U.K.
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