Analysis of contacts and V-defects in GaN device structures by transmission electron microscopy
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 2001-11-13
著者
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HUMPHREYS Colin
Department of Materials Science and Metallurgy, University of Cambridge
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J.humphreys Colin
Department Of Materials Science And Metallurgy University Of Cambridge
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Humphreys Colin
Department Of Materials Science And Metallurgy University Of Cambridge
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N.BRIGHT Alexander
Department of Materials Science and Metallurgy, University of Cambridge
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SHARMA Nikhil
Department of Materials Science and Metallurgy, University of Cambridge
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Sharma Nikhil
Department Of Materials Science And Metallurgy University Of Cambridge
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N.bright Alexander
Department Of Materials Science And Metallurgy University Of Cambridge
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Bright Alexander
Department of Materials Science and Metallurgy, University of Cambridge
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