Synchronized B and
スポンサーリンク
概要
- 論文の詳細を見る
The nanometer-range depth resolution of secondary ion mass spectrometry (SIMS) profiles in diamond was achieved by the determination of the depth resolution function (DRF). The measurement of this DRF was performed thanks to isotopic-enriched diamond delta structures composed of <sup>12</sup>C and <sup>13</sup>C. The artificial SIMS broadening observed on the <sup>13</sup>C depth profiles of buried doped diamond epilayers was eliminated and replaced by a boxlike <sup>13</sup>C depth profile. Applied to boron delta-doped diamond structures, this analysis has resolved edge widths close to 0.3 nm/dec, as compared with 1.5 nm/decade on the raw SIMS data.
- 2013-04-25
著者
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Teraji Tokuyuki
National Inst. For Materials Sci. Ibaraki Jpn
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KOIZUMI Satoshi
National Institute for Research in Inorganic Materials
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Teraji Tokuyuki
National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan
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Fiori Alexandre
Institut Néel, CNRS and Université Joseph Fourier, BP 166, 38042 Grenoble Cedex 9, France
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Jomard François
GEMaC, CNRS and Université Versailles St Quentin, 45, avenue des Etats-Unis, 78035 Versailles Cedex, France
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Isoya Junichi
Tsukuba University, Tsukuba, Ibaraki 305-8550, Japan
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Gheeraert Etienne
Institut Néel, CNRS and Université Joseph Fourier, BP 166, 38042 Grenoble Cedex 9, France
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Bustarret Etienne
Institut Néel, CNRS and Université Joseph Fourier, BP 166, 38042 Grenoble Cedex 9, France
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Koizumi Satoshi
National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan
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Gheeraert Etienne
Institut Néel, CNRS and Université Joseph Fourier, BP 166, 38042 Grenoble Cedex 9, France
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Bustarret Etienne
Institut Néel, CNRS and Université Joseph Fourier, BP 166, 38042 Grenoble Cedex 9, France
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