Anisotropic Diffusion Filter Based Blob-Mura Defect Detection in Thin Film Transistor Liquid Crystal Display Panel
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概要
- 論文の詳細を見る
In this paper, an anisotropic diffusion filter was employed to extract a background image in a thin film transistor liquid crystal display (TFT-LCD) panel image. The background image extracted by an iterative filtering was simply subtracted from a test image to detect blob-Mura defects. To reduce a processing time, we simply modified a conventional anisotropic diffusion filter and evaluated its results. The black and white bob-Mura defects which were included in the same image could be detected separately using only threshold values. Through simulation it was verified that the proposed method has a superior capability of detecting blob-Mura defects.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2010-07-25
著者
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Choi Doo-hyun
School Of Electrical Engineering And Computer Science Kyungpook National University
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Song Young-chul
School Of Electrical Engineering And Computer Science Kyungpook National University
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Choi Doo-Hyun
School of Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, Puk-gu, Daegu 702-701, Korea
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- Multiscale Detection of Defect in Thin Film Transistor Liquid Crystal Display Panel
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