Split Bregman Method-Based Background Extraction for Blob-Mura Defect Detection in Thin Film Transistor-Liquid Crystal Display Image
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概要
- 論文の詳細を見る
- 2011-04-01
著者
-
Park Kil-houm
School Of Electrical Engineering And Computer Science Kyungpook National University
-
Song Young-chul
School Of Electrical Engineering And Computer Science Kyungpook National University
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