Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System
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概要
- 論文の詳細を見る
- 2010-06-01
著者
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PARK Kil-Houm
School of Electrical Engineering and Computer Science, Kyungpook National University
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Park Kil-houm
School Of Electrical Engineering And Computer Science Kyungpook National University
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Han Chan-ho
Department Of Broadcasting Visual Technology Kangwon National University
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JOO Young-Bok
Department of Computer Science, Yonsei University
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Joo Young-bok
Department Of Computer Science Yonsei University
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