Multiscale Detection of Defect in Thin Film Transistor Liquid Crystal Display Panel
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概要
- 論文の詳細を見る
A new automated inspection algorithm is proposed for detecting blob-Mura defects based on multiscale in a thin film transistor liquid crystal display (TFT-LCD) panel. As such, new kernels with different sizes are defined and then used to detect blob-Mura defects with varying sizes and brightness levels. To extract a seed point, an adaptive multilevel-threshold method is employed. Initially, smaller kernels are used to detect smaller defects, then gradually larger kernels are applied to detect larger defects. Through simulation it was verified that the proposed algorithm has a superior capability for detecting blob-Mura defects.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-08-15
著者
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Park Kil-houm
School Of Electrical Engineering And Computer Science Kyungpook National University
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Choi Doo-hyun
School Of Electrical Engineering And Computer Science Kyungpook National University
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Song Young-chul
School Of Electrical Engineering And Computer Science Kyungpook National University
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Park Kil-Houm
School of Electrical Engineering and Computer Science, Kyungpook National University, Daegu, Korea
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