Application of Piecewise Linear Regression Twice to Inspect The Defective Regions on Thin Film Transistor Liquid Crystal Display Panels
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概要
- 論文の詳細を見る
- 2011-08-01
著者
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Park Kil-houm
School Of Electrical Engineering And Computer Science Kyungpook National University
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KIM Se-Yun
School of Electrical Engineering and Computer Science, Kyungpook National University
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Kim Se-yun
School Of Electrical Engineering And Computer Science Kyungpook National University
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JUNG Chang-Do
Department of Mathematics, Kyungpook National University
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Jung Chang-do
Department Of Mathematics Kyungpook National University
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Lim Yongdo
Department Of Mathematics Kyungpook National University
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JUNG Chang-Do
School of Electrical Engineering and Computer Science, Kyungpook National University
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KIM Hyunduk
Department of Mathematics, Kyungpook National University
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Kim Hyunduk
Department Of Mathematics Kyungpook National University
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- Effective Defect Detection in Thin Film Transistor Liquid Crystal Display Images Using Adaptive Multi-Level Defect Detection and Probability Density Function
- Application of Piecewise Linear Regression Twice to Inspect The Defective Regions on Thin Film Transistor Liquid Crystal Display Panels
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