A Flashover Prediction Method for Contaminated Insulators using a Stochastic Analysis of Leakage Current

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2004-05-15

著者

• Choi Doo-hyun

  School Of Electrical Engineering And Computer Science Kyungpook National University

• SONG Young-Chul

  School of Electrical Engineering and Computer Science, Kyungpook National University

• Song Young-chul

  Department Of Industrial Technology Purdue University

• PARK Jae-Jun

  Department of Electrical and Electronic Engineering, Joongbu University

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• A Flashover Prediction Method for Contaminated Insulators using a Stochastic Analysis of Leakage Current
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• Kernel Adjusted Wiener Filter for Image Enhancement
• Anisotropic Diffusion Filter Based Blob-Mura Defect Detection in Thin Film Transistor Liquid Crystal Display Panel
• Multiscale Detection of Defect in Thin Film Transistor Liquid Crystal Display Panel
• A Flashover Prediction Method for Contaminated Insulators using a Stochastic Analysis of Leakage Current

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