Choi Doo-hyun | School Of Electrical Engineering And Computer Science Kyungpook National University
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概要
関連著者
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Choi Doo-hyun
School Of Electrical Engineering And Computer Science Kyungpook National University
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Song Young-chul
School Of Electrical Engineering And Computer Science Kyungpook National University
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Song Young-chul
Department Of Industrial Technology Purdue University
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PARK Kil-Houm
School of Electrical Engineering and Computer Science, Kyungpook National University
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Park Kil-houm
School Of Electrical Engineering And Computer Science Kyungpook National University
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Choi D‐h
School Of Electrical Engineering And Computer Science Kyungpook National University
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SONG Young-Chul
School of Electrical Engineering and Computer Science, Kyungpook National University
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Park K‐h
School Of Electrical Engineering And Computer Science Kyungpook National University
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SONG Young-Chul
Department of Industrial Technology, Purdue University
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PARK Jae-Jun
Department of Electrical and Electronic Engineering, Joongbu University
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Park Jae-jun
Department Of Electrical And Electronic Engineering Joongbu University
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Song Young‐chul
Kyungpook National Univ. Daegu Kor
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Choi Doo-Hyun
School of Electrical Engineering and Computer Science, Kyungpook National University, Daegu 702-701, Korea
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Choi Doo-Hyun
School of Electrical Engineering and Computer Science, Kyungpook National University, Daegu, Korea
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Choi Doo-Hyun
School of Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, Puk-gu, Daegu 702-701, Korea
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Song Young-Chul
School of Electrical Engineering and Computer Science, Kyungpook National University, Daegu 702-701, Korea
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Park Kil-Houm
School of Electrical Engineering and Computer Science, Kyungpook National University, Daegu, Korea
著作論文
- Wavelet-Based Image Enhancement for Defect Detection in Thin Film Transistor Liquid Crystal Display Panel
- Multiscale Detection of Defect in Thin Film Transistor Liquid Crystal Display Panel
- A Flashover Prediction Method for Contaminated Insulators using a Stochastic Analysis of Leakage Current
- Kernel Adjusted Wiener Filter for Image Enhancement
- Anisotropic Diffusion Filter Based Blob-Mura Defect Detection in Thin Film Transistor Liquid Crystal Display Panel
- Multiscale Detection of Defect in Thin Film Transistor Liquid Crystal Display Panel
- A Flashover Prediction Method for Contaminated Insulators using a Stochastic Analysis of Leakage Current