Relationship between Reverse-Biased Electrostatic-Discharge Tolerance and Aging of GaInAsP/InP Buried-Heterostructure Laser Diodes

概要

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Degradation due to electrostatic discharge (ESD) is an important reliability issue for GaInAsP/InP buried-heterostructure laser diodes (LDs). Although this degradation mechanism has been previously discussed, the relationship between ESD tolerance and aging has not been investigated. For forward-biased ESD, the degradation mechanism is similar to that of catastrophic optical damage. Therefore, ESD tolerance can be assumed to decrease during an aging test. However, the relationship between reverse-biased ESD tolerance and aging is less clear. We investigated this relationship, focusing particularly on reverse bias, and observed a decrease in ESD tolerance owing to aging. Specifically, the ESD tolerances decreased by approximately 30 and 70% for facet-coated and uncoated GaInAsP/InP Fabry–Perot LDs, respectively, as a result of aging longer than 3000 h. We determined that facet coating is effective in suppressing the reduction in ESD tolerance caused by aging.
Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
2009-04-25