Scanning Capacitance Microscopy Evaluation of Lead Zirconate Titanate Film Formed by Aerosol Deposition Method
スポンサーリンク
概要
- 論文の詳細を見る
The local electric properties of lead zirconate titanate (PZT) film prepared by the aerosol deposition method (ADM) were investigated by scanning capacitance microscopy (SCM) using a self-sensing probe. Although an obvious ferroelectric response cannot be observed from macroscopic polarization versus applied electric field ($P$–$E$) measurements for the as-deposited PZT film, capacitance images showed a distinctive contrast as the result of the spatial variation of local dielectric permittivity. The scanning capacitance spectroscopy (SCS) measurements show that there are localized regions which have poor ferroelectricity, and this is the cause of the nominal ferroelectric properties of as-deposited PZT film.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-03-30
著者
-
Ogiso Hisato
Advanced Process Technology Group Institute Of Mechanical Engineering National Institute Of Advanced
-
Naitou Yuichi
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
-
Naitou Yuichi
Nanoelectronics Research Institute (NeRI), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
-
Ogiso Hisato
Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-2-1 Namiki, Tsukuba, Ibaraki 305-8564, Japan
-
Ogiso Hisato
Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology, 1-2-1 Namiki, Tsukuba, Ibaraki 305-8564, Japan
関連論文
- Demonstration of Dopant Profiling in Ultrathin Channels of Vertical-Type Double-Gate Metal-Oxide-Semiconductor Field-Effect-Transistor by Scanning Nonlinear Dielectric Microscopy
- Tip-Induced Deformation of Graphene on SiO2 Assessed by Capacitance Measurement
- Tip-to-Sample Distance Dependence of $dC/dZ$ Imaging in Thin Dielectric Film Measurement
- Correlation Between Surface Topography and Static Capacitance Image of Ultrathin SiO2 Films Evaluated by Scanning Capacitance Microscopy
- Capacitive Imaging of Graphene Flakes on SiO2 Substrate
- Evaluation of Domain Boundary of Piezo/Ferroelectric Material by Ultrasonic Atomic Force Microscopy
- Scanning Capacitance Microscopy Evaluation of Lead Zirconate Titanate Film Formed by Aerosol Deposition Method