Optical Constants of CVD-SiC Mirrors Produced by Different Processes from 200 to 1000 eV
スポンサーリンク
概要
- 論文の詳細を見る
The optical constants of seven CVD-SiC mirrors produced by different processes have been measured in the soft X-ray region (200–1000 eV) by means of the reflectance method. In spite of the difference in the production process, no dependence of the optical constants on the samples was found. The photon-energy dependence of the optical constants for CVD-SiC is represented in terms of power formulas over a range of 300–1000 eV. It is also found that the rms surface roughness estimated by the reflectance method is always larger than the value measured with a WYKO optical profilometer.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 1989-01-20
著者
-
Koide Tsuneharu
Photon Factory Imss High Energy Accelerator Research Organization
-
Yanagihara Mihiro
Research Institute For Scientific Measurements Tohoku University
-
Sato Shigeru
Photon Factory National Laboratory For High-energy Physics
-
Yanagihara Mihiro
Research Institute for Scientific Measurements, Tohoku University, Katahira, Sendai, Miyagi 980
-
Takeda Shigekatsu
Toshiba Ceramics Co., Ltd., Nishi-Shinjuku, Shinjuku-ku, Tokyo 163
-
Iijima Akio
CANON Inc., Shimomaruko, Ohta-ku, Tokyo 146
関連論文
- Optical Constants of TiC_, VC_ and NbC_ from 0.8 to 80 eV
- Optical Properties of CeO_2 Crystal in the Photon Energy Range of 2.5-40 eV
- Piezoreflectance of Rubidium Chloride in the Vacuum Ultraviolet Region from 6 to 30 eV
- Piezoreflectance of Potassium Iodide in the Vacuum Ultraviolet Region from 5 to 30 eV
- Near-Normal Reflectance Spectra of CeO_2 and Ce_xLa_Al_2 System
- Observation of Undulator Radiation. : I. Operation Studies and Visual Observation
- X-ray Absorption and X-ray Magnetic Circular Dichroism Studies of a Monatomic Fe(001) Layer Facing a Single-Crystalline MgO(001) Tunnel Barrier
- Resonant Photoemission Study on Valence Band Satellites of Cu_xNi_and Ag_xPd_Alloy Systems
- Electronic States of Ce_xLa_Cu_6 Studied by Resonant Photoemission
- Comparison between 3p-XPS and 3d-XPS of LaAl_2,CeAl_2 and CeRu_2
- Extreme Ultraviolet Absorption Spectra of Alkali Metals
- Extreme Ultraviolet Absorption Spectra of K-Rb and K-Cs alloys
- Magnetic Interaction between Adsorbed NO and fcc Co (001) Thin Films Studied by X-ray Magnetic Circular Dichroism
- Soft X-Ray Optical Constants: Pt, Ag, and Cu : Techniques, Instrumentations nad Measurement
- Pressure Shifts of Valence and Core Exciton Peaks in Potassium Iodide
- Effects of the Core Hole Potential on the B 1s Emission in Hexagonal BN
- A Soft-X-Ray Imaging Microscope with a Multilayer-Coated Schwarzschild Objective : Imaging Tests
- Effect of Coulomb Interaction in the Resonant X-Ray Emission Spectra of Hexagonal BN
- Photoemission Study of CeCu_6
- Buried Interfaces in Mo/Si Multilayers Studied by Soft-X-Ray Emission Spectroscopy
- Zero-Order-Free, Multilayer-Coated Laminar Grating in the 31 nm Region
- Consistency of the Surface Roughness Determined from Soft-X-Ray Reflectance and Surface Profiles Measured Using a Scanning Tunnelling Microscope : Coherence Length of the Soft X-Rays
- Electronic and magnetic properties of Heusler alloy Co2MnSi epitaxial ultrathin films facing a MgO barrier studied by x-ray magnetic circular dichroism
- X-ray absorption spectroscopy and x-ray magnetic circular dichroism of epitaxially grown Heusler alloy Co2MnSi ultrathin films facing a MgO barrier
- Optical Constants of CVD-SiC Mirrors Produced by Different Processes from 200 to 1000 eV