Consistency of the Surface Roughness Determined from Soft-X-Ray Reflectance and Surface Profiles Measured Using a Scanning Tunnelling Microscope : Coherence Length of the Soft X-Rays
スポンサーリンク
概要
- 論文の詳細を見る
- 1996-04-01
著者
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YAMAMOTO Masaki
Research Institute for Scientific Measurements, Tohoku University
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Yanagihara Mihiro
Research Institute For Scientific Measurements Tohoku University
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Sasaki Takuya
Research Institute For Scientific Measurements Tohoku University
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FURUDATE Minaji
Research Institute for Scientific Measurements, Tohoku University
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Furudate Minaji
Research Institute For Scientific Measurements Tohoku University
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Yamamoto Masaki
Research Institute For Scientific Measurements Tohoku University
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Yamamoto Masaki
Research Center For Soft X-ray Microscopy Imram Tohoku University
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