Precision Measurement of 83Kr Mössbauer Wavelength
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概要
- 論文の詳細を見る
The 83Kr Mössbauer wavelength was precisely measured using two diffractions of (733) and ($55\bar{1}$) in a float-zone grown (FZ) silicon crystal. The interval of the two diffraction peaks was only 0.0631°, which could be easily determined with high accuracy. The wavelength of the 83Kr first excitation level was $0.13184021\pm4$ nm, corresponding to an energy of $9404.130\pm3$ eV.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2006-02-25
著者
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Zhang Xiaowei
Photon Factory (pf) Institute Of Materials Structure Science High Energy Accelerator Research Organi
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Kawauchi Taizou
Institute Of Industrial Science University Of Tokyo
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Okano Tatsuo
Institute Of Industrial Science The University Of Tokyo
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Fujimoto Hiroyuki
Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technology
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Okano Tatsuo
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
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Zhang Xiaowei
Photon Factory, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan
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Fujimoto Hiroyuki
Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 1, Tsukuba, Ibaraki 305-8561, Japan
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- Summary Abstract
- Precision Measurement of 83Kr Mössbauer Wavelength