Development of Accumulation Pressure Gauge for XHV Measurement

スポンサーリンク

概要

• 論文の詳細を見る
• 1994-09-20

著者

• Okano Tatsuo

  Institute Of Industrial Science The University Of Tokyo

• TERADA Keiko

  Institute of Industrial Science, University of Tokyo

• NAKAYAMA Mitsuyasu

  Institute of Industrial Science, University of Tokyo

• Terada Keiko

  Institute Of Industrial Science University Of Tokyo

• Nakayama Mitsuyasu

  Institute Of Industrial Science University Of Tokyo

関連論文

• 22aYE-4 First principles study of H_2 interaction with Fe(OH)_3 : Effect of molecular orientation on the ortho-para H_2 conversion
• New Method to Enhance the ortho-para H_2 Conversion by using Dynamical Quantum Filtering Effect and Steric Effect
• 29pPSA-34 Molecular Orientation Dependence of o-p H_2 Conversion in Scattering Process
• Probing Local Surface Reactivity With Hydrogen Molecules : Realizing an Atom/Molecule Scanning Probe
• Scattering Dynamics of Hydrogen Molecules on Metal Alloy Surfaces : Probing Local Surface Reactivity with Hydrogen Molecules
• Precision Measurement of ^Kr Mossbauer Wavelength
• Adsorption and Wetting Structures of Kr on Pt(111) at 8K and 45K Studied by Scanning Tunneling Microscopy
• Hydrogen as the Cause of Step Bunching Formed on Vicinal GaAs(001)
• Measurement of Field-Emission Current-Fluctuations by Digital Autocorrelation of Electron-Counting
• Vibrational Excitations of Methane Monolayer Physisorbed on Ag(111) Surfaces
• Development of Accumulation Pressure Gauge for XHV Measurement
• Structure of Iron Silicide film on Si(111) Grown by Solid-Phase Epitaxy and Reactive Deposition Epitaxy
• Molecular Orientation Dependence of o–p Conversion of H2 Scattered from a 3d Impurity Sitting on a Metal Oxide Surface
• Summary Abstract
• Precision Measurement of 83Kr Mössbauer Wavelength

もっと見る 閉じる

スポンサーリンク