Atomic Force Microscopy Observation of Stretched DNA on Graphite Surfaces
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概要
- 論文の詳細を見る
We have stretched unmodified DNA and cisplatin-modified DNA on highly oriented pyrolytic graphite (HOPG) surfaces, which were observed by atomic force microscopy (AFM). Both DNA molecules were partly straightened on HOPG surface with bends and branches present. Statistical analysis on the bending angle for these two samples revealed that cisplatin-modified DNA has a prominent distribution to 30 degrees. We conclude that this finding results from the local structural change caused by the binding of cisplatin molecule.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2003-05-15
著者
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Kanno Takashi
The Institute Of Scientific And Industrial Research Osaka University
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Kawai Tomoji
The Institute Of Science And Industrial Research (isir-sanken) Osaka University
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Yamamoto Itsuki
The Institute Of Scientific And Industral Research Osaka University
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Tanaka Hiroyuki
The Institute Of Science And Industrial Research (isir-sanken) Osaka University:jst Presto
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Kawai Tomoji
The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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