Preparation of LaNi5 films and effects of hydrogen absorption on electrical resistivities of the films.
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概要
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Thin films of LaNi<SUB>5</SUB> have been prepared by means of a flash evaporation-deposition technique. Electric resistivity measurements on these films were carried out in an atmosphere of hydrogen. The films formed on quartz substrates were amorphous. Resistivities initially increased and then decreased during the absorption of hydrogen. During the desorption process, the reverse phenomenon was observed. The effect of the thickness of the films on the electric properties, during the hydrogen absorption-desorption process, was also studied. Sample pulverization could be avoidable by using films of less than 10 μm in thickness. The hydrogen contents of the films were determined by the quartz-crystal mass-monitoring (QCMM) method.
- 公益社団法人 日本化学会の論文
著者
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Adachi Gin-ya
Department Of Applied Chemistry Faculty Of Engineering Osaka University
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Nagai Hiroshi
Department Of Anatomy Okayama University School Of Dentistry
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Shiokawa Jiro
Department of Applied Chemistry, Faculty of Engineering, Osaka University
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Sakaguchi Hiroki
Department of Applied Chemistry, Faculty of Engineering, Osaka University
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Niki Ken-ichi
Department of Applied Chemistry, Faculty of Engineering, Osaka University
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