X-ray fluorescence spectroscopy of binary silicate glasses.

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概要

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• The Si <I>K</I><SUB>α</SUB> emission lines of the several silicon compounds and binary silicate (Na, K, Rb, and B-silicates) glasses were measured. In the binary silicates, negative energy shifts from that of SiO<SUB>2</SUB> were observed. They were interpreted as indicating a relative decrease of the quantity of charge transfer from silicon to oxygen, when more electropositive elements like alkali metals are located on the next nearest neighbor positions of the silicon atoms. The Si <I>K</I><SUB>α</SUB> shifts of silicate glasses have a good correlation with the basicity of their melts.

• 公益社団法人 日本化学会の論文

著者

• YOKOKAWA Toshio

  Department of Chemistry, Faculty of Science, Hokkaido University

• Yokokawa Toshio

  Department Of Chemistry Faculty Of Science Hokkaido University

• Maekawa Takashi

  Department Of Applied Chemistry Faculty Of Engineering Ehime Universiry

• Kikuchi Niro

  Department of Chemistry, Faculty of Science, Hokkaido University

• Sumita Shigekazu

  Department of Chemistry, Faculty of Science, Hokkaido University

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