Use of ion microanalyzer in the analysis of passive layers on stainless steel.

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概要

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• Passive layers on various stainless steels were studied with an ion microanalyzer. An argon ion beam was directed on the specimen surface in an oxygen atmosphere. The use of oxygen atmosphere effectively minimized the difference in ion yields of the elements in the oxidized layers and matrices, making it possible to determine these elements with good reproducibility. 18% Cr–8% Ni and 18% Cr–8% Ni–0.4% Ti stainless steel was exposed to neutral water containing 8 ppm oxygen at 289 °C. The passive layers contained larger amounts of iron and smaller amounts of chromium than the matrices.

• 公益社団法人 日本化学会の論文

著者

• Okajima Yoshiaki

  Hitachi Research Lab. Hitachi Lid.

• Aizawa Yukiyoshi

  Hitachi Research Lab ., Hitachi Ltd.,

• Sugawara Yasushi

  Hitachi Research Laboratory, Hitachi Ltd.

関連論文

• TEM Observations of Initial Crystallization States for LPCVD Si Films : Condensed Matter
• Quantitative Analysis of Oxygen in Oxygen-Doped Polycrystalline Silicon Films with Ion Microanalyzer
• Solid-State Reaction between Manganese Thin Filmsand Silicon carbide
• Measurement of Sputtering Rate for 10 keV O^+_2 Ions with Ion Microanalyzer
• Quantitative Analysis of High Temperature Alloys with an Ion Microanalyzer
• Sputtering of Vacuum Deposited Metal Films by Oxygen Ion Bombardment
• Use of ion microanalyzer in the analysis of passive layers on stainless steel.

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