Effect of interface inversion on thermal stress field in CZ crystal growth of oxide.
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概要
- 論文の詳細を見る
For CZ crystal growth of an oxide (Al<SUB>2</SUB>O<SUB>5</SUB>), finite element analyses of the thermal stress field in the crystal are carried out, and the effect of interface shape on the maximum shear stress in the crystal is investigated.<BR>When the crystal rotation rate increases, with other operating conditions unchanged, the melt/crystal interface changes its shape from convex to concave toward the melt at the critical Reynolds number (<I>Re<SUB>s</SUB></I><SUP>*</SUP>). When <I>Re<SUB>s</SUB></I> < <I>Re<SUB>s</SUB></I><SUP>*</SUP>, the maximum value of the thermal stress on the interface is insensible to <I>Re<SUB>s</SUB></I> and its radial profile is an inversed W-shape. When <I>Re<SUB>s</SUB></I> exceeds <I>Re<SUB>s</SUB></I><SUP>*</SUP>, however, thermal stress on the interface increases very rapidly and its radial profile becomes W-shaped.
- The Society of Chemical Engineers, Japanの論文
著者
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Imaishi Nobuyuki
Institute Of Advanced Material Study Kyushu University
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HOZAWA MITSUNORI
Chemical Research Institute of Non-Aqueous Solutions, Tohoku Univ.
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TSUKADA TAKAO
Chemical Research Institute of Non-Aqueous Solutions, Tohoku University
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