Conductance between Two Scanning-Tunneling-Microscopy Probes in Carbon Nanotubes(Condensed matter: electronic structure and electric, magnetic, and optical properties)
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概要
- 論文の詳細を見る
The conductance image between two probes of scanning tunneling microscopy (STM) is calculated in an armchair carbon nanotube within a tight-binding model and a realistic model for STM probes. A Kekule-type pattern usually appears due to interference of states at K and K' points except in special cases.
- 社団法人日本物理学会の論文
- 2008-02-15
著者
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Ando Tsuneya
Department Of Physics Faculty Of Science University Of Tokyo
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Nakanishi Takeshi
National Inst. Advanced Industrial Sci. And Technol. Ibaraki
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Nakanishi Takeshi
National Institute Of Advanced Industrial Science And Technology
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