Surface Damage of Whisker-Type Cold Emitter after Overload Test
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-09-15
著者
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Ito Hiroki
Depatment Of Materials Sci. And Technol. Nagaoka Univ. Of Technol.
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斎藤 秀俊
長岡技術科学大学
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Saitoh Hidetoshi
慶応義塾大学 放射線科学
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Shimotono Hidetoshi
Department Of Physics Kyoto University
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Saitoh Hidetoshi
Department Of Bioresource Science Obihiro University Of Agriculture And Veterinary Medicine
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WASHIO Tsukasa
Nagooka University of Technology
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OHKAWARA Yoshiaki
Nagooka University of Technology
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OHSHIO Shigeo
Nagooka University of Technology
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ITO Haruhiko
Nagooka University of Technology
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SAITOH Hidetoshi
Nagooka University of Technology
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Saitoh Hidetoshi
School Of Radiologic Sciences Tokyo Metropolitan University Of Health Sciences
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斉藤 博
Department Of Material Science And Technology Nagaoka University Of Technology
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Ohshio S
Department Of Material Science And Technology Nagaoka University Of Technology
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Washio Tsukasa
Department Of Material Science And Technology Nagaoka University Of Technology
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Saitoh Hidetoshi
Department Of Radiological Sciences Ibaraki Prefectural University Of Health Sciences
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Satoh Hitoshi
Ibaraki Prefectural Univ. Dept. Radilogical Sci.
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