The Roughness-Enhanced Light Emission from Metal-Oxide-Silicon Light-Emitting Diodes Using Very High Vacuum Prebake : Semiconductors
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-03-15
著者
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Lin C‐f
National Taiwan Univ. Twn
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Lin C‐f
National Chiao Tung Univ. Hsinchu Twn
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LEE Min-Hung
Department of Electrical Engineering and Graduate Institute of Electronics Engineering, National Tai
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CHEN Kuan-Fu
Department of Electrical Engineering and Graduate Institute of Electronics Engineering, National Tai
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LAI Chang-Chi
Department of Electrical Engineering and Graduate Institute of Electronics Engineering, National Tai
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LIU Chee
Department of Electrical Engineering and Graduate Institute of Electronics Engineering, National Tai
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PAI Woei-Wu
Center for Condensed Matter Sciences, National Taiwan University
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CHEN Miin-Jang
Department of Electrical Engineering and Graduate Institute of Electro-Optical Engineering, National
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LIN Ching-Fuh
Department of Electrical Engineering and Graduate Institute of Electro-Optical Engineering, National
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Lee Min-hung
Department Of Electrical Engineering And Graduate Institute Of Electronics Engineering National Taiw
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Lai Chang-chi
Department Of Electrical Engineering And Graduate Institute Of Electronics Engineering National Taiw
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Pai Woei-wu
Center For Condensed Matter Sciences National Taiwan University
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Liu Chee
Department Of Electrical Engineering And Graduate Institute Of Electronics Engineering National Taiw
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Chen Kuan-fu
Department Of Electrical Engineering And Graduate Institute Of Electronics Engineering National Taiw
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Chen Miin-jang
Department Of Electrical Engineering And Graduate Institute Of Electro-optical Engineering National
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