Surface Structure of Si(111)-√<3>×√<3>-Ag Studied by Averaged LEED Analysis
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概要
- 論文の詳細を見る
Low energy electron diffraction constant momentum transfer average (LEED/CMTA) technique has been applied to the Ag/Si(111) surface. The specularly reflected (00) beam analysis for the Si(111)-√<3>×√<3>-Ag structure verifies the recently proposed model where the ordered Ag layer is embedded below the topmost Si layer. A considerable displacement of the Si subsurface is also suggested.
- 社団法人応用物理学会の論文
- 1981-05-05
著者
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OURA Kenjiro
Electron Beam Laboratory, Faculty of Engineering, Osaka University
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HANAWA Teruo
Electron Beam Laboratory, Faculty of Engineering, Osaka University
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Hanawa Teruo
Electron Beam Laboratory Faculty Of Engineering Osaka University
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Terada Yasushi
Electron Beam Laboratory Faculty Of Engineering Osaka University
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Oura Kenjiro
Electron Beam Laboratory Faculty Of Engineering Osaka University
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YOSHIZUKA Tohru
Electron Beam Laboratory, Faculty of Engineering, Osaka University
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Yoshizuka Tohru
Electron Beam Laboratory Faculty Of Engineering Osaka University
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