The Effect of Disc Structure on the Characteristics of the Phase-Change Medium
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概要
- 論文の詳細を見る
The effects of disc structure on the characteristics of the phase-change medium are investigated with a tester at the wavelength of 680 nm. The carrier-to-noise (CNR) and erase ratio depend upon the thickness of the upper dielectric layer and disc structure of the phase-change media. CNR exceeds 50 dB when the thickness of the upper dielectric layer is 300Å-675Å and erase ratio is above 25 dB when the thickness of the upper dielectric layer is either 300Å or 600Å-700Å. CNR is 50 dB when the Al layer is 500Å-880Å-thick and erase ratio is 25 dB when the Al layer is 500Å-650Å-thick. The results cannot be explained by optical simulations. The erase ratio is sensitive to the thickness of the upper dielectric layer, which is in good agreement with the results of thermal simulations. It is unfavorable for CNR and erase ratio when the reflective layer is below 400Å or above 700Å. However, some of the structures are useful for rewritable discs.
- 社団法人応用物理学会の論文
- 1999-03-30
著者
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Huang Der-ray
Opto-electronics & Systems Labs. Industrial Technology Research Institute
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Huang Der-ray
Opto-electronics & Systems Lab. Itri
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JENG TzuanRen
Opto-Electronics & Systems Lab.
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CHIANG DonYau
Opto-Electronics & Systems Lab.
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Jeng Tzuanren
Opto-electronics & Systems Labs. Industrial Technology Research Institute
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Chiang D
Opto-electronics & Systems Labs. Industrial Technology Research Institute
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Liao Wen-yih
Department Of Materials Science And Engineering National Tsing Hua University
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LEE Sanboh
Department of Materials Science and Engineering, National Tsing Hua University
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Lee Sanboh
Department Of Materials Science And Engineering National Tsing Hua University
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HUANG Der-Ray
Opto-Electronics & Systems Labs., Industrial Technology Research Institute
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