Dynamic Testing of Phase Change Disk with Varied Dielectric Layer Thickness

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概要

• 論文の詳細を見る

• The upper dielectric layer of phase change disk affects markedly on recording characteristics. It is found that the threshold writing power decreases as the thickness of this layer increases. The erasibility is also related to the thickness of this layer. From the cycle test of erase and write, the disk structure in this article presented that the CNR value degrades about 1dB when the cycle times increase one order of 10.

• 社団法人電子情報通信学会の論文
• 1996-11-21

著者

• Huang Der-ray

  Opto-electronics & Systems Lab. Itri

• Huang Der-ray

  Opto-electronics & Systems Lab. Itri Hsinchu

• Jeng Tzuan-ren

  Opto-electronics & Systems Lab. Itri Hsinchu

• Chiang Don-yau

  Opto-electronics & Systems Lab. Itri Hsinchu

• Liao Wen-yih

  Opto-electronics & Systems Lab. Itri Hsinchu

• CHEN Jiin-Sen

  Opto-Electronics & Systems Lab., ITRI, Hsinchu

• LIU Chung

  E.E. Dept., Yuan-Ze Institute of Technology, Taoyuan

• Chen Jiin-sen

  Opto-electronics & Systems Lab. Itri Hsinchu

• Liu Chung

  E.e. Dept. Yuan-ze Institute Of Technology Taoyuan

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