Dynamic Testing of Phase Change Disk with Varied Dielectric Layer Thickness

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概要

• 論文の詳細を見る

• The upper dielectric layer of phase change disk affects markedly on recording characteristics. It is found that the threshold writing power decreases as the thickness of this layer increases. The erasibility is also related to the thickness of this layer. From the cycle test of erase and write, the disk structure in this article presented that the CNR value degrades about 1 dB when the cycle times increase one order of 10.

• 社団法人映像情報メディア学会の論文
• 1996-11-21

著者

• Huang D‐r

  Industrial Technol. Res. Inst. Hsinchu Twn

• JENG TzuanRen

  Opto-Electronics & Systems Lab.

• CHEN JiinSen

  Opto-Electronics & Systems Lab.

• CHIANG DonYau

  Opto-Electronics & Systems Lab.

• HUANG DerRay

  Opto-Electronics & Systems Lab.

• LIAO WenYih

  Opto-Electronics & Systems Lab.

• LIU ChungPing

  E.E. Dept., Yuan-Ze Institute of Technology

• Liao W‐y

  National Tsing Hua Univ. Hsinchu Twn

• Chen Jiinsen

  Opto-electronics & Systems Lab.

• Jeng Tzuanren

  Opto-electronics & Systems Lab.

• Liu Chungping

  E.e. Dept. Yuan-ze Institute Of Technology

• Chiang Donyau

  Opto-electronics & Systems Lab.

関連論文

• Dynamic Testing of Phase Change Disk with Varied Dielectric Layer Thickness
• Kinetic Crystallization Behavior of Phase-Change Medium
• The Effect of Disc Structure on the Characteristics of the Phase-Change Medium
• Magneto-Optical Properties of M-O Media Affected by Substrates
• New Write-Once Medium with NiOx Film Using Blue Laser

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