Atomic Force Microscopy of Cracks on Si(100) and GaAs(100) Caused by Vickers Indenter
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概要
- 論文の詳細を見る
- 1996-06-30
著者
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山田 弘司
核融合科学研究所
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山田 啓文
京都大学工学研究科電子工学専攻
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NAKAYAMA Kan
National Research Laboratory of Metrology
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Hamada Y
Nagoya Municipal Industrial Res. Inst. Nagoya Jpn
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MISAWA Guento
National Research Laboratory of Metrology
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YAMADA Hirofumi
National Research Laboratory of Metrology
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SEINO Yutaka
National Institute of Advanced Industrial Science and Technology
関連論文
- 物理学と核融合, 菊池満著, 京都大学学術出版会, 2009年, 258ページ, ISBN978-4876989317
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