YAMADA Hirofumi | National Research Laboratory of Metrology
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概要
関連著者
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山田 弘司
核融合科学研究所
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山田 啓文
京都大学工学研究科電子工学専攻
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NAKAYAMA Kan
National Research Laboratory of Metrology
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Hamada Y
Nagoya Municipal Industrial Res. Inst. Nagoya Jpn
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YAMADA Hirofumi
National Research Laboratory of Metrology
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KAGESHIMA Masami
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Kageshima M
National Inst. Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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Kageshima Masami
Joint Research Center For Atom Technology National Institute Of Advanced Industrial Science And Tech
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Kageshima M
Joint Research Center For Atom Technology (jrcat)
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Kageshima Masami
Department Of Applied Physics Graduate School Of Engineering Osaka University
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KAWAZU Akira
Department of Applied Physics, The University of Tokyo
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Nakayama Kazuhiko
Mechanical Processing Technology Research Laboratories Kao Corporation
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TOKUMOTO Hiroshi
Electrotechmical Laboratory
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MORITA Yukinori
National Institute for Advanced Interdisciplinary Research
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TOKUMOTO Hiroshi
National Institute for Advanced Interdisciplinary Research
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Morita Y
Matsushita Electric Industrial Co. Ltd. Osaka Jpn
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Tokumoto Hiroshi
Jrcat National Institute For Advanced Interdisciplinary Research
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Tokumoto Hiroshi
Elecltrotechnical Laboratory
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Tokumoto Hiroshi
Electrotechnical Laboratory (etl)
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Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat)
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Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat):national Institute Of Advanced Industrial Science
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Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat)-national Institute Of Advanced Industrial Science
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Kawazu A
Department Of Applied Physics University Of Tsukuba
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Kawazu Akira
Department Of Applied Physics Faculty Of Engineering University Of Tokyo:(present Address) Komatsu E
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Nakayama K
National Inst. Advanced Industrial Technol. And Sci. Ibaraki Jpn
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Morita Y
Consortium Fuer Elektrochemishe Ind. Gmbh Muenchen Deu
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Morita Yukinori
National Inst. Of Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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MISAWA Guento
National Research Laboratory of Metrology
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SEINO Yutaka
National Institute of Advanced Industrial Science and Technology
著作論文
- Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy
- Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy
- Atomic Force Microscopy of Cracks on Si(100) and GaAs(100) Caused by Vickers Indenter