Critical Surface Tension of Silicon Films and Aligning Properties of Nematic MBBA Molecules
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概要
- 論文の詳細を見る
A method for estimating the critical surface tension of obliquely deposited silicon films is presented.It is based on the measurement of equilibrium contact angles of sessile drops of test liquids with different surface tensions. The critical surface tension calculated by the equation 1+(cosθ_a)/(r_W)=2/(γ_L)(√<γ^d_Lγ^d_C>+√<γ^p_Lγ^p_C>) is 48.4 dyn/cm. The aligning properties of nematic MBBA molecules are also discussed.
- 社団法人応用物理学会の論文
- 1979-07-05
著者
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YAMASHITA Masato
Department of Electrical Engineering, University of Industrial Technology
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Amemiya Yoshifumi
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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Yamashita Masato
Department Of Electrical Engineering Faculty Of Engineering Nagoya University:(present Address)toshi
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Yamashita Masato
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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AMEMIYA Yoshifumi
Department of Electrical Engineering, Faculty of Engineering, Nagoya, University
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