A Comparison of the Kinetics and the Evolution of Microstructure of the Solid Phase Crystallized a-(Si_<0.7>Ge_<0.3>/Si) and a-(Si/Si_<0.7>Ge_<0.3>) Bilayer Films; Interface versus Surface Nucleated Films
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1998-02-01
著者
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KIM Tae-Hoon
Faculty of Pharmaceutical Sciences, Okayama University
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Kim T‐h
Seoul National Univ. Seoul Kor
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Kim K‐b
Seoul National Univ. Seoul Kor
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Kim Ki-bum
Division Of Materials Science And Engineering Seoul National University
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Kim Ki-bum
Research Institute Of Advanced Materials School Of Materials Science And Engineering Seoul National
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KIM Tae-Hoon
Division of Materials Science and Engineering, Seoul National University
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RYU Myung-Kwan
Division of Materials Science and Engineering, Seoul National University
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Ryu Myung-kwan
Division Of Materials Science And Engineering Seoul National University
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Kim Tae-hoon
Division Of Materials Science And Engineering Seoul National University
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