Nanometer-Scale Imaging of Lattice Deformation with Transmission Electron Micrograph
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1998-12-15
著者
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Ide T
Device Analysis And Evaluation Technology Center Nec Corporation
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SAKAI Akira
Fundamental Research Laboratories, NEC Corporation
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Shimizu Keiji
Device Analysis And Evaluation Technology Center Nec Corporation
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IDE Takashi
Device Analysis and Evaluation Technology Center, NEC Corporation
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Ide Takashi
Device Analysis And Evaluation Technology Center Nec Corporation
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Sakai Akira
Fundamental Research Laboratories Nec Corporation
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- Imaging p-n Junctions by Scanning Auger Microscopy
- Nanometer-Scale Imaging of Lattice Deformation with Transmission Electron Micrograph
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