Imaging p-n Junctions by Scanning Auger Microscopy
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1998-08-15
著者
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Shimizu Keiji
Device Analysis And Evaluation Technology Center Nec Corporation
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IDE Takashi
Device Analysis and Evaluation Technology Center, NEC Corporation
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HIROSHIMA Seiichi
Device Analysis and Evaluation Technology Center, NEC Corporation
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Ide Takashi
Device Analysis And Evaluation Technology Center Nec Corporation
関連論文
- Imaging p-n Junctions by Scanning Auger Microscopy
- Nanometer-Scale Imaging of Lattice Deformation with Transmission Electron Micrograph