Carrier-Lifetime-Limited Fast Photoconductive Photodetectors on Iron-Diffused GaAs
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概要
- 論文の詳細を見る
Deep acceptors of iron have been employed to overcompensate n-GaAs epitaxial layers and to reduce its carrier lifetime. The photodetectors exhibited current pulses with full widths at half-maxium (FWHMs) as short as 72 ps in spite of the large spacing of 15 μm between the electrodes. The dependence of response time and responsivity on the bias voltage shows that the carrier lifetime rather than the transit time limits the speed, and that collection efficiency of photogenerated electrons mainly limits the sensitivity. Absence of the usual long tail in the pulse responses might be due to a distinctive optical property of the iron level at E_V+0.52 eV.
- 社団法人応用物理学会の論文
- 1993-08-01
著者
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Ohsawa Jun
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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Migitaka Masatoshi
Department Of Information And Control Engineering Toyota Technological Institute
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HASHIMOTO Nobuhiko
Department of Information and Control, Toyota Technological Institute
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Hashimoto N
Univ. Electro‐communications Tokyo Jpn
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