Rhenium Tips for Scanning Tunneling Microscopy in Air
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概要
- 論文の詳細を見る
The performance of rhenium (Re) tips has been investigated for scanning tunneling microscopy in air. Both tips machined mechanically and tips etched electrochemically from poly-crystalline wires were examined and the tip apexes were observed with a transmission electron microscope. Stable atomic images of graphite surfaces were almost always obtained using the Re tips sharpened mechanically, whose apexes were jagged and had thin oxide layers. Atomic images were not obtained, however, with the electrochemically etched Re tips, whose contamination layers were field-evaporated and the apexes of which were controlled so that a single atom was on the apex of the (112^^-0) surface, although atomic images were always observed stably in UHV with these tips.
- 社団法人応用物理学会の論文
- 1995-03-15
著者
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Kinno T
Toshiba Corp. Kawasaki Jpn
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Kinno Teruyuki
Toshiba R & D Center
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Watanabe Miyoko
Toshiba R & D Center
関連論文
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- Growth Condition Independence Observed for DX Centerin Si-doped AlGaAs Grown by Molecular Beam Epitaxy
- Rhenium Tips for Scanning Tunneling Microscopy in Air
- Electron Activation Energy in Si-Doped AlGaAs Grown by MBE
- Effects of the Growth Conditions on Deep Level Concentration in MOCVD GaAs
- Rhenium Tips for Stable Scanning Tunneling Microscopy