A Four-Terminal GaAs Multiple-Function Transistor with a Buried Silicon-Doping Quantum Well
スポンサーリンク
概要
- 論文の詳細を見る
A four-terminal MESFET-like GaAs multiple-function transistor (MFT) with a buried silicon-doping quantum well has been demonstrated by low-pressure metalorganic chemical vapor deposition (LP-MOCVD). The vertical GaAs negative resistance field-effect transistor (NERFET) based on real-space transfer exhibits a high current driving capability, a high peak-to-valley ratio up to 2160, and a high transconductance of 2.1 S /mm at room temperature. In addition, we carried out an ohmic recess to form nonallyed contacts which are electrically isolated from ohmic electrodes. By virtue of nonalloyed ohmic contacts, a planar metal-semiconductor field-effect transistor (MESFET) has been fabricated on the same wafer successfully. The MESFET with a 2×100 μm^2 gate exhibits a maximum extrinsic transconductance of 70 mS/mm, a saturation current density of 172 mA/mm, and a Schottky breakdown voltage larger than 15 V at room temperature.
- 社団法人応用物理学会の論文
- 1994-10-01
著者
-
HSU Wei-Chou
Department of Electrical Engineering, National Cheng-Kung University
-
Hsu Wei-chou
Department Of Electrical Engineering National Cheng Kung University
-
Hsu Wei-chou
Department Of Electrical Engineering National Cheng-kung Universiry
-
SHIEH Hir-Ming
Department of Electronic Engineering, Kung-Shan Institute of Technology
-
WU Chang-Luen
Department of Electrical Engineering, National Cheng Kung University
-
Wu Chang-luen
Department Of Electrical Engineering National Cheng-kung Universiry
-
Shieh Hir-ming
Department Of Electrical Engineering National Cheng Kung University
-
Shieh Hir-ming
Department Of Electrical Engineering Private Kung-san Institute Of Technology And Commerce
-
TSAI Ming-Shang
Department of Electrical Engineering, National Cheng-Kung Universiry
-
Tsai Ming-shang
Department Of Electrical Engineering National Cheng-kung Universiry
関連論文
- Regenerative Switching Phenomenon of a GaAs Metal-n-δ(p^+)-n-n^+ Structure
- Emitter Edge-Thinning Effect on InGaAs/InP Double-Heterostructure-Emitter Bipolar Transistor
- Mobility Enhancement in Highly Strained δ-Doped InP/InGaAs/InP Heterostructure with InGaP Cap Layer Grown by Low-Pressure Metalorganic Chemical Vapor Deposition
- High-Temperature Breakdown Characteristics of δ-Doped In_Ga_P/GaAs/In_Ga_As/AlGaAs High Electron Mobility Transistor
- An Improved In_Ga_P/GaAs Double Heterostructure-Emitter Bipolar Transistor Using Emitter Edge-Thinning Technique
- A Study of Layer Thickness and Interface Qualities of Strained ln_xGa_As/GaAs Layers
- Enhanced Two-Dimensional Electron Gas Concentrations and Mobilities in Multiple δ-Doped GaAs/In_Ga_As/GaAs Pseudomorphic Heterostructures
- A Four-Terminal GaAs Multiple-Function Transistor with a Buried Silicon-Doping Quantum Well
- Improved Selectively δ-Doped GaAs/InGaAs Double-Quantum-Well Pseudomorphic HFET's Utilizing a Buried P-Layer on the Buffer