Accommodation of Large Lattice Mismatch of GaP on GaAs(100) and GaAs on GaP(100) Layers Grown by MBE
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概要
- 論文の詳細を見る
To investigate the accommodation of a large lattice mismatch, the misfit strain of a GaP layer grown on a GaAs(100) substrate and a GaAs layer grown on a GaP(100) substrate were studied by X-ray diffraction and Raman spectroscopy as a function of the layer thickness. Epilayers were grown by MBE. The misfit strain began to relaxed at a thickness of 50 nm for GaP and 80 nm for GaAs. The magnitude of the saturated strain was 0.48% for GaP and 0.13% for GaAs. These magnitudes are insufficient to make a coherent interface. The tendency of our results are different from Matthews' prediction. His theory deals with layer-by-layer growth. Whereas the RHEED pattern showed an island formation during the initial stage of growth, subsequent islands coalesced to form a flat surface. Thus, the difference between the prediction and the experimental results was probably due to the difference in the growing mechanism.
- 社団法人応用物理学会の論文
- 1987-06-20
著者
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ISHIKAWA Kenji
Research Institute of Electronics, Shizuoka University
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Nomura Takashi
Research Institute for Cell Engineering (RICE), National Institute of Advanced Industrial Science an
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Hagino Minoru
Research Institute of Electronics, Shizuoka University
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Hagino Minoru
Research Institute Of Electronics Shizuoka University
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Ishikawa Kenji
Research Institute Of Electronics Shizuoka University
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MIYAO Masahiro
Research Institute of Electronics, Shizuoka University
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MAEDA Yuuji
Research Institute of Electronics, Shizuoka University
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Miyao M
Muroran Inst. Technol. Hokkaido Jpn
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Miyao Masahiro
Research Institute Of Electronics Shizuoka University
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Maeda Yuuji
Research Institute Of Electronics Shizuoka University:(present Address) Asahi Glass Co. Ltd.
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Nomura Takashi
Research Institute For Cell Engineering (rice) National Institute Of Advanced Industrial Science And
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