Photo-Deep-Level Fourier Spectroscopy in Semi-Insulating Bulk Materials
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1985-11-20
著者
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Ishii Yoshikazu
Musashino Electrical Communication Laboratory Ntt
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IKEDA Kousuke
Musashino Electrical Communication Laboratory, NTT
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TAKAOKA Hidetoshi
Musashino Electrical Communication Laboratory, NTT
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Ikeda Kousuke
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Takaoka H
Ntt Applied Electronics Lab. Tokyo Jpn
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Takaoka Hidetoshi
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
関連論文
- Photo-Deep-Level Fourier Spectroscopy in Semi-Insulating Bulk Materials
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- Stacking Faults from Oxide Precipitates in CZ Silicon : B-3: CRYSTAL GROWTH AND DEFECTS
- Growth of Stacking Faults by Bardeen-Herring Mechanism in Czochralski Silicon
- Deep Level Fourier Spectroscopy for Determination of Deep Level Parameters
- Single Thermal Scan DLTS Method