Takaoka Hidetoshi | Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

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概要

• 同名の論文著者
• Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporationの論文著者

関連著者

• TAKAOKA Hidetoshi

  Musashino Electrical Communication Laboratory, NTT

• Takaoka Hidetoshi

  Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

• Inoue Naohisa

  Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

• Inoue Naohisa

  Musashino Electrical Communication Laboratory Nippon Tel

• IKEDA Kousuke

  Musashino Electrical Communication Laboratory, NTT

• Ikeda Kousuke

  Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

• Kohra Kazutake

  Faculty Of Engineering Tokyo University:(present Address)national Laboratory For High Energy Physics

• Ishii Yoshikazu

  Musashino Electrical Communication Laboratory Ntt

• Wada Kazumi

  Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

• Ikuta Kenji

  Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

• Ikeda Kousuke

  Musashino Electrical Communication Laboratory Ntt

• TATSUOKA Yutaka

  Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation

• OOSAKA Jiro

  Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation

• Takaoka H

  Ntt Applied Electronics Lab. Tokyo Jpn

• Takaoka Hidetoshi

  Musashino Electrical Communication Laboratory Ntt

• Oosaka Jiro

  Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

• Tatsuoka Yutaka

  Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

• INOUE Naohisa

  Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation

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著作論文

• Photo-Deep-Level Fourier Spectroscopy in Semi-Insulating Bulk Materials
• Electrical Characterization of Micro Defects in Silicon Crystal : C-3: CRYSTAL TECHNOLOGY
• Stacking Faults from Oxide Precipitates in CZ Silicon : B-3: CRYSTAL GROWTH AND DEFECTS
• Growth of Stacking Faults by Bardeen-Herring Mechanism in Czochralski Silicon
• Deep Level Fourier Spectroscopy for Determination of Deep Level Parameters

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